Atomic force microscope with optimal replacement fluid cell

ABSTRACT

An atomic force microscope which is readily useable for researchers for its intended use without extensive lost tome for setup and repair. The probe used therein is a cantilevered optical lever which imparts surface information in a gentle and reliable manner by reflecting an incident laser beam. The probe (20) is carried by a replaceable probe-carrying module (48) which is factory set up and merely inserted and fine tuned by the user. Calibration tools are provided to make initial set up and fine tuning of the microscope a simple and straightforward operation requiring little or no technical talent. The probe module (48) is mechanically coupled to a probe module support (38) so that the probe is substantial alignment with a deflection detection system (26, 66). &lt;IMAGE&gt;



